Device testing

four-point-probeFour point probe

The Keithlink four point probe is composed of a table top 4 point prober with a 4 point probe head for manual probing. The software can base on the sample geometry and thickness to measure out Resistance [W], Sheet Resistance [W/□], Volume Resistivity [W-cm], and Conductivity [S-cm-1].

Examples of use:

Film resistance measurement.

Purpose:

Electrical device characterisation

Material systems:

Electronic devices and materials.

Scale/volume:

Single chip or wafer.

Specifications/resolution:

1 mm spacing tungsten carbide probes (150 µm radius).

Model:

Four point probe

Site:

The University of Queensland

Location:

Room 908, Level 9, COPE (Bldg #68), St Lucia

Instrument Contact:

Kai-Yu Liu


semiautomatic-probe-stationSemiautomatic probe station

The Semiprobe SA-6 is a high speed tabletop probing system designed to provide reliable accurate wafer probes for 6” wafers or smaller. Ideally suited for tabletop production applications, the SA-6 is configurable for RF/microwave, failure analysis, MEMS, optoelectronics, discrete device characterisation, and R & D applications. The probe station is integrated with our device testing glove box.

Examples of use:

  • Failure analysis
  • Device characterisation

Purpose:

Fast semiautomatic probing station for testing and characterisation of circuitry devices and displays.

Material systems:

Electronic devices and materials.

Scale/volume:

Single 6” wafer or smaller.

Specifications/resolution:

4 probe DC probe station for measuring electrical properties of materials and devices.

Model:

Semiprobe SA-6

Site:

The University of Queensland

Location:

Room 910, Level 9, COPE (Bldg #68), St Lucia

Instrument Contact:

Kai-Yu Liu


semi-conductor-analyserSemiconductor device analyser

The Agilent B1500A Semiconductor Device Analyser is an all in one analyser supporting IV, CV, pulse/dynamic IV and more, which is designed for all-round characterisation from basic to cutting-edge applications. It provides a wide range of measurement capabilities to cover the electrical characterisation and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency.

The easyexpert software provides a wide array of measurement functions: sweep/spot, multichannel sweep, list sweep, time sampling, quasi-static CV, high frequency CV (to 5 MHz), and a direct control mode. Easyexpert is also supplied with an extensive library of over 230 application tests.

Examples of use:

Characterisation of transistors, diodes, photonic devices, etc.

Purpose:

A device analyser for testing of organic and electronic circuits.

Scale/volume:

Single sample.

Specifications/resolution:

Testing of electronic devices down to 10 FA.

Model:

Agilent B1500A

Site:

The University of Queensland

Location:

Room 110, Level 1, Parnell (Bldg #7), St Lucia

Instrument Contact:

Kai-Yu Liu


solar-cell-qe-ipce-iv-measurement-systemSolar cell QE/IPCE/IV measurement system

The PV Measurements QEX7 Quantum Efficiency(QE)/Spectral Response(SR)/Incident Photon to Current Conversion Efficiency(IPCE)/IV Measurement System is a low-cost, high-performance quantum efficiency measurement system, which is capable of delivering high speed measurements on most types of solar cells. The system is designed for fast, high accuracy measurements of dye sensitized, Perovskite, crystalline and amorphous silicon, CdTe, and similar devices. The system is integrated with our device testing glove box.

The QEX7 uses a xenon arc lamp source, monochromator, filters and reflective optics to provide stable monochromatic light to a photovoltaic test device. A broadband bias light also illuminates the test device to simulate end-use conditions. The system uses a detection circuit designed to maximize measurement speed and accuracy for solar cell development.

solar-simulatorIV measurement feature

The integrated current–voltage (IV) measurement enables the system to perform IV measurements on small devices, without changing any electrical connections or remounting the sample. For measurements with approximated light intensities, the built-in bias light can be used as the light source. Higher accuracy measurements can be achieved using a separate solar simulator, available from PV Measurements. Maximum current is 200 mA.

Examples of use:

Solar cell measurements.

Purpose:

Solar cell characterisation.

Material systems:

Any.

Scale/volume:

Single solar cell.

Specifications/resolution:

  • 300 nm to 1 100 nm scan range (1 400 nm range available)
  • High resolution scan in under 1 minute
  • Probe beam from 1 mm to 20 mm
  • Seamless switching between DC and AC measurement modes
  • 1 Hz to 120 Hz chopping frequency
  • CE marked
  • One white bias light
  • Integrated IV measurement

Model:

PV Measurements QEX7 QE/SR/IPCE/IV Measurement System

Site:

The University of Queensland

Location:

Room 910, Level 9, COPE (Bldg #68), St Lucia

Instrument Contact:

Kai-Yu Liu


Wire bonder

The K&S Model 4526 Auto-Stepback Wedge Bonder is used with aluminum wire, gold wire and ribbon. It is particularly appropriate for high quality applications requiring tight control of wire length and loop formation.

The 4526 offers control of individual bond parameters and programmable loop formation along with the capability of using a wide variety of wires. The bonding head, with the deep access option and tail adjust system, makes it ideal for deep cavity microwave applications where tight control over the tail length is required.

Examples of use:

Microwave, chip on board.

Purpose:

Packaging and microelectronics interfacing of devices to prototype level.

Material systems:

Gold and silver.

Scale/volume:

Single sample bonding.

Specifications/resolution:

Pad size of 80 µm and wire diameter of 25 µm.

Model:

K&S Model 4526 Auto-Stepback Wedge Bonder

Site:

The University of Queensland

Location:

PC2 Laboratory, Level 2E, AIBN (Bldg #75), St Lucia

Instrument Contact:

Kai-Yu Liu