Proxy facilities

Many research groups have pieces of equipment that are under-used. There are often instances where external users wish to access this equipment. ANFF-Q can provide business services to our clients to facilitate this access. Please contact us for details.

The current instruments available through facilitated access are listed below.


AR-G2 rheometerar-g2-rheometer

The AR-G2 from TA Instruments is an advanced controlled stress, direct strain and controlled rate rheometer with a magnetic-levitation thrust bearing and a drag cup motor to allow nanotorque control. The device is suitable for testing of melts, fluids and interfaces.

A broad spectrum of bulk rheological measurements can be performed with this instrument, varying from linear dynamic characterisation, the determination of yield stresses, monitoring the kinetics of curing and crystallisation, the determination of the structure of samples by means of dynamic testing after different pre-shear histories.

A wide range of cones (1°/40 mm and 2°/60 mm) and plates (diameters ranging from 20 to 60 mm) is available.

Site:

The University of Queensland

Location:

Cooper-White Lab, Level 4W, AIBN (Bldg #75), St Lucia

Instrument Contact:

Anita Gibson


DektakXT stylus profiler

The DektakXT stylus profiler features a revolutionary design that enables unmatched repeatability of 4 Å and up to 40 % improved scanning speeds. This major milestone combined with its other breakthroughs, uniquely enable the DektakXT to perform the critical nanometre-level film, step and surface measurements needed to power future advances in the microelectronics, semiconductor, solar, high-brightness LED, medical, scientific and materials science markets.

DektakXT is the first stylus profiler to implement a single-arch design, the first to incorporate a true-colour HD optical camera, and the first to harness 64-bit parallel processing architecture to achieve optimal measurement and operating efficiency.

The Dektak XT can closely monitor deposition and etch rate uniformity, as well as thin film stress, in semiconductor manufacturing. Dektak XT provides the ability to quickly and easily set up and run automated multi-site measurement routines to verify the precise thickness of thin films across the wafer surface, down to the nanometre scale. The unmatched repeatability of the Dektak XT gives you the accurate film thickness and stress measurements you need to precisely adjust etch and deposition processes to improve yields.

The Dektak XT can measure the critical dimensions of silver traces (streets), the conductive lines found on mono and poly crystalline solar panels. The height, width, and continuity of the silver traces correlates to a solar cell’s ability to conduct energy. The Dektak XT employs a trace analysis routine that reports a street’s critical dimensions to verify that exactly the sufficient material for conductivity is present.

Examples of use:

The Dektak XT is ideal for routine qualification of surface roughness on precision machined parts for a wide variety of industries, including automotive, aerospace, and medical devices.

Dektak is the only stylus profiler to measure large vertical features of sensitive materials (up to 1 mm tall) with angstrom-level repeatability. Researchers in MEMS and microfluidics industries can rely on Dektak XT for the critical measurements needed to verify their parts are built to specification. The low force measurement capability, NLite+, applies a light touch to sensitive materials to measure vertical steps and roughness accurately without damaging the sample’s surface.

Purpose:

The DektakXT performs stylus profilometry (contact measurement) nanometre-level film, step and surface measurements.

Material systems:

Standard photoresists, semiconductor, soft and hard materials with step height up to 1 mm in thickness.

Scale/volume:

Sample X/Y stage: motorised 150 mm X/Y, manual levelling.

Sample R-Theta Stage: manual, continuous 360 degrees; motorised, continuous 360 degrees.

Maximum sample thickness = 50 mm (1.95 in.).

Maximum wafer size = 200 mm (8 in.).

Specifications/resolution:

Step height repeatability: 4 Å, 1 sigma on steps ≤1 μm (30 scans using a 12.5 μm stylus).

Vertical range: 1 mm (0.039 in.).

Vertical resolution: Å (@ 6.55 μm range).

Scan length range: 55 mm (2 in.); 200 mm (8 in.) with scan stitching capability.

Data points per scan: 120 000 maximum.

Model:

DektakXT

Site:

The University of Queensland

Location:

Room 512, Level 5, AEB (Bldg #49), St Lucia

Instrument Contact:

Doug Mair


oca-20OCA 20

The OCA 20 is a video-supported contact angle measuring instrument. Whatever substances you examine, whether they are surfactant solutions, liquid phases of micro-emulsions or molten metals and polymers, the OCA 20 will calculate the surface and interfacial tension from the contours of pendant and sessile drops as well as of liquid lamellae on plates, bars and fibres.

Site:

The University of Queensland

Location:

Cooper-White Lab, Level 4W, AIBN (Bldg #75), St Lucia

Instrument Contact:

Anita Gibson


Olympus LEXT OLS4100 laser scanning digital microscope

With the Olympus LEXT OLS4100 laser scanning digital microscope non-contact 3D observations and measurements of surface features at 10 nanometre resolutions are easy to produce. The OLS4100 industrial microscope has distinctive features for fast image acquisition and high-resolution microscope images over a wider area.

Model:

Olympus LEXT OLS4100 laser scanning digital microscope

Site:

The University of Queensland

Location:

Huang Lab, Level 1, Mansergh Shaw Building (#45), St Lucia

Instrument Contact:

Anita Gibson