Journal: Review of Scientific Instruments Year: 2019 Issue: 1 Pages: -Authors: Balakrishnan, V.; Dinh, T.; Nguyen, T.; Phan, H. P.; Nguyen, T. K.; Dao, D. V.; Nguyen, N. T.
Journal: 2018 Ieee Micro Electro Mechanical Systems Year: 2018 Issue: - Pages: 882-885Authors: Nguyen, T. K.; Phan, H. P.; Han, J. S.; Dinh, T.; Foisal, A. M.; Zhu, Y.; Nguyen, N. T.; Dao, D. V.
Journal: Ieee Electron Device Letters Year: 2018 Issue: 4 Pages: 580-583Authors: Dinh, T.; Phan, H. P.; Nguyen, T. K.; Balakrishnan, V.; Cheng, H. H.; Hold, L.; Lacopi, A.; Nguyen, N. T.; Dao, D. V.
Journal: Physica Status Solidi a-Applications and Materials Science Year: 2018 Issue: 24 Pages: -Authors: Phan, HP ;Nguyen, TK ;Dinh, T ;Cheng, HH ;Mu, FW ;Iacopi, A ;Hold, L ;Dao, DV ;Suga, T ;Senesky, DG ;Nguyen, NT
Journal: Scientific Reports Year: 2018 Issue: - Pages: -Authors: Wei, Jonathan C. J.; Haridass, Isha N.; Crichton, Michael L.; Mohammed, Yousuf H.; Meliga, Stefano C.; Sanchez, Washington Y.; Grice, Jeffrey E.; Benson, Heather A. E.; Roberts, Michael S.; Kendall, Mark A. F.
