ANFF-Q has instrument suites in material and surface characterisation including atomic force, Raman and confocal laser scanning microscopes, optical profilers, and thermal analysis and vibrational spectroscopy tools. These instruments can be used for:

  • nanoscale material and surface characterisation
  • electrical materials characterisation
  • determining interaction forces
  • mechanical properties mapping
  • thin film thickness measurements
  • thin film characterisation
  • 3D reconstruction of topologically complex structures at high resolution
  • sharp imaging of thick specimens at varying depths
  • determining chemical compositions of samples

If you would like to engage our ANFF-Q Professional Officers to characterise something for you, email us your specifications. An ANFF-Q staff member will respond within two working days to discuss your project and provide you with a quote for the requested work.